Clustering-based production-line binning of ICs Based on $I_{DDQ}$
Ritesh P. Turakhia,
Anura P. Jayasumana,
and Yashwant K. Malaiya
Proc. Int. Worksh. Current & Defect Based Testing (DBT 2003), IEEE, Apr 2003, pp. 65–73
http://www.cs.colostate.edu/~malaiya/turakhia_paper.pdf
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